Characterization in Compound Semiconductor Processing
副标题：无
作 者：Gary E. McGuire；Yale E. Strausser[著]
分类号：
ISBN：9787560342818
微信扫一扫,移动浏览光盘
简介
《化合物半导体加工中的表征(英文)》由哈尔滨工业大学出版社出版。
目录
Preface to the Reissue of the Materials Characterization Series ix
Preface to Series x
Preface to the Reissue of Characterization of Compound
Semiconductor Processing xi
Preface xiii
Contributors xv
CHARACTERIZATION OF III—V THIN FILMS FOR
ELECTRONIC DEVICES
III—V COMPOUND SEMICONDUCTOR FILMS FOR
OPTICAL APPLICATIONS
CONTACTS
DIELECTRIC INSULATING LAYERS
OTHER COMPOUND SEMICONDUCTOR FILMS
DEEP LEVEL TRANSIENT SPECTROSCOPY： A CASE STUDY
ON GaAs
APPENDIX： TECHNIQUE SUMMARIES
Preface to Series x
Preface to the Reissue of Characterization of Compound
Semiconductor Processing xi
Preface xiii
Contributors xv
CHARACTERIZATION OF III—V THIN FILMS FOR
ELECTRONIC DEVICES
III—V COMPOUND SEMICONDUCTOR FILMS FOR
OPTICAL APPLICATIONS
CONTACTS
DIELECTRIC INSULATING LAYERS
OTHER COMPOUND SEMICONDUCTOR FILMS
DEEP LEVEL TRANSIENT SPECTROSCOPY： A CASE STUDY
ON GaAs
APPENDIX： TECHNIQUE SUMMARIES
Characterization in Compound Semiconductor Processing
- 名称
- 类型
- 大小
光盘服务联系方式: 020-38250260 客服QQ：4006604884
云图客服：
用户发送的提问，这种方式就需要有位在线客服来回答用户的问题，这种 就属于对话式的,问题是这种提问是否需要用户登录才能提问
Video Player
×
Audio Player
×
pdf Player
×
